A dedicated, automated, timesaving and user-friendly system that enable TEM/STEM and SEM sample preparation for both cross section and plan view in a wide range of application. Featuring a cryo-cooled, dry sawing process, the EM3 system prepares specimens of either crystalline or amorphous materials. The output sample is mounted onto a compatible TEM mount that …
Xact200 performs cutting-edge TEM/STEM sample preparation in line with the Semiconductor and Nanotechnology roadmap requirements for next generation physical FA and characterization. The Xact200 is a second-generation system uniquely combines the disruptive innovative AIM technology with an integrated FE SEM column, in process real time STEM imaging capability and piezo based multi axes eucentric manipulator. …
Perfect Cleave Mechanism (PCM) is a simple manual cleaving tool for cross-section of crystalline materials such as Si, GaN, GaAs, InPh, SiC and others. PCM utilizes SELA’s proprietary Perfect Cleaving technologies to achieve fast cleaving of crystalline materials with perfect quality of cross-section. The PCM had been presented to semiconductor market and delivered to customers …
The SELA MC10 smart micro cleaving system is the advanced solution for the SEM sample preparation of crystalline materials with high quality, high accuracy and high throughput. The MC10 utilizes and delivers to customers enhanced capabilities of wining SELA’s Micro Cleaving technology. The MC10 smart table top system achieves semi-automatic, reliable, repeatable and rapid cross-sectioning …
The SELA newest MC10i smart micro cleaving system with capability of liquid nitrogen spraying is the advanced solution for the SEM sample preparation of crystalline materials with high quality, high accuracy and high throughput. The MC10i utilizes and delivers to customers enhanced capabilities of wining SELA’s Micro Cleaving technology. The MC10i smart table top system …
The SELA MC20 smart micro cleaving system with capability to register and cleave buried defects is the advanced solution for the SEM sample preparation of crystalline materials with high quality, high accuracy and high throughput. The MC20 utilizes and delivers to customers enhanced capabilities of wining SELA’s Micro Cleaving technology together with the state-of-the-art optics. …
MC600i is a fifth generation version of the award-wining Nano Cleaving series of the sample preparation systems for cross-section of crystalline materials for following SEM inspection and other analyses. The MC600i system utilizes Nano Cleaving and Micro Cleaving technologies in two main processes – full process and fast process. SELA’s Nano Cleaving and Micro Cleaving …
